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JEDEC JESD 24-7 1992 Edition, August 1, 1992
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Commutating Diode Safe Operating Area Test Procedure for Measuring DV/DT During Reverse Recovery of Power Transistors
Includes all amendments and changes through Reaffirmation Notice , October 2002
Additional Comments: ADDENDUM TO JEDEC JESD 24
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Defines methods for verifying the diode recovery stress capability of power transistors.