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JEDEC JESD 24-7

1992 Edition, August 1, 1992

Complete Document

Commutating Diode Safe Operating Area Test Procedure for Measuring DV/DT During Reverse Recovery of Power Transistors

Includes all amendments and changes through Reaffirmation Notice , October 2002


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ADDENDUM TO JEDEC JESD 24
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Description / Abstract:

Defines methods for verifying the diode recovery stress capability of power transistors.