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JEDEC JESD 38

1995 Edition, December 1, 1995

Complete Document

Standard for Failure Analysis Report Format



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Referenced Items:

IEEE 260
IEEE 268

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Description / Abstract:

This standard is to promote unification of content and format of semiconductor device failure-analysis reports so that reports from diverse laboratories may be easily read, compared, and understood by customers. Additional objectives are to ensure that reports can be easily ready by users, satisfactorily reproduced on copying machines, adequately transmitted by telefax, and conveniently stored in standard filing cabinets.