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JEDEC JESD 51-1 1995 Edition, December 1, 1995
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Integrated Circuit Thermal Measurement Method - Electrical Test Method (Single Semiconductor Device)
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The purpose of this test method is to define a standard Electrical Test Method (ETM) that can be used to determine the thermal characteristics of single integrated circuit devices housed in some form of electrical package. This method will provide a basis for comparison of different devices housed in the same electronic package or similar devices housed in different electronic packages.