JEDEC JESD 53186th Edition, July 1, 1986Complete DocumentThermal Resistance Test Method for Signal and Regulator Diodes (Forward Voltage, Switching Method)
Includes all amendments and changes through Reaffirmation Notice , April 2002
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Product Details:
 Description / Abstract:
This standard describes a test method for measuring the thermal
resistance of signal and regulator diodes. The need for
modification of this test method arose out of the limited
description that existed earlier for both signal and regulator
diode applications in testing for thermal resistance. Previously
published as ID-13. ANSI/EIA-531-1986 (July) expired June 1996.
Became JESD531 after reaffirmation April 2002.
 
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