1850890

JEDEC JESD226

RF Biased Life (RFBL) Test Method

standard by JEDEC Solid State Technology Association , 01/01/2013

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Full Description

This stress method is used to determine the effects of RF bias conditions and temperature on Power Amplifier Modules (PAMs) over time. These conditions are intended to simulate the devices? operating condition in an accelerated way, and they are expected to be applied primarily for device qualification and reliability monitoring.
 

Product Details

Published:
01/01/2013
Number of Pages:
20
File Size:
1 file , 170 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus