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JIS C 7021

77th Edition, March 1, 1977

Complete Document

Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices

Includes all amendments and changes through Reaffirmation Notice , March 1, 1980


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ENGLISH * W/D NO S/S
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Product Details:

  • Revision: 77th Edition, March 1, 1977
  • Published Date: March 1, 1980
  • Status: Not Active, See comments below
  • Document Language: English
  • Published By: Japanese Standards Association (JSA)
  • Page Count: 72
  • ANSI Approved: No
  • DoD Adopted: No

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