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MIL-S-19500/251 Revision H, January 5, 1995
Complete Document
Superseded By: MIL-PRF-19500/251
Includes all amendments and changes through Amendment 1, November 27, 1996
Additional Comments: CNCL S/S BY MIL-PRF-19500/251
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This specification covers the detail requirements for NPN, silicon, switching transistors. Four levels of product assurance are provided for each device type as specified in MIL-S-19500.

See figure 1 (similar to TO-39, TO-5).

TABLE Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving this document should be addressed to: US Army Research Laboratory ATTN: AMSRL-EP-RD, Fort Monmouth, NJ, 07703-5601 by using the Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this document or by letter.


The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DODISS) and supplement thereto, cited in the solicitation (see 6.2).


       MIL-S-19500     -   Semiconductor Devices, General Specification for.



       MIL-STD-750     -   Test Methods for Semiconductor Devices.

(Unless otherwise indicated, copies of federal and military specifications, standards, and handbooks are available from the Standardization Documents Order Desk, Building 4D, 700 Robbins Avenue, Philadelphia, PA 19111-5094.)

In the event of a conflict between the text of this specification and the references cited herein, the text of this specification shall take precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained.