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MIL-STD-883

Revision K, May 3, 2018

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TEST METHOD STANDARD MICROCIRCUITS

Includes all amendments and changes through Change 3, May 3, 2018


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Referenced Items:

ANSI Z540.1
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Description / Abstract:

This is designed for small packages with less than 0.1 cm3 internal free volume and packages that have not qualified to 2.2.2. This test may be used for larger than 0.1 cm3 internal free volume packages. Packages up to 0.1 cm3 internal free volume suspected of very large leaks are commonly subjected to this test.