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MIL-STD-883

Revision K, February 22, 2017

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TEST METHOD STANDARD MICROCIRCUITS

Includes all amendments and changes through Change 2, February 22, 2017


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Referenced Items:

ANSI Z540.1
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Description / Abstract:

The intended use of this standard is to establish appropriate conditions for testing microcircuit devices to give test results that simulate the actual service conditions existing in the field. This standard has been prepared to provide uniform methods, controls, and procedures for determining with predictability the suitability of such devices within Military, Aerospace and special application equipment. This standard is applicable only to microelectronic devices, i.e. monolithic, multi-chip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed