This test plan defines the requirements of data bus components
which comply with the requirements of MIL-STD-1553B, Digital Time
Division Command/Response Multiplex Data Bus.
The requirements of the test plan shall apply to data bus
components designed to meet MIL-STD-1553B, when invoked in a
specification or a statement of work. The test plan may be used for
both design verification and production testing of data bus
This test plan addresses only the electrical characteristics of
the data bus components. Differences between data bus systems will
exist due to particular program requirements and designer options.
The system designer and contractor must therefore allow for the
effects of temperature, vibration, sealing, EMI/EMP, and other
environmental factors on data bus component characteristics.
Consideration of these factors will improve the possibility that
data bus components will operate properly when used in the intended
The pass/fail requirements of the test plan shall be met under
all system operating environments. The DC resistance criteria,
however, are assumed to be measured at 25°C and would have to be
corrected for measurements made at another temperature.
For the purposes of this test plan, it must be possible to
identify all bus and stub connections, the selected bus cable
characteristic impedance, the transformer winding resistances, and
the values of any series and terminating resistors used within the
coupler. This information must be included in a supporting
documentation package provided by the bus coupler or bus terminator
Because transformer coupled data bus couplers may contain
terminating resistors and/or have cables attached, it will not be
possible to directly test the transformer and resistors in every
case. In such cases the transformers and resistors shall be tested
prior to assembly to verify they meet the requirements of
MIL-STD-1553B. Again, system designers must make allowances for the
expected environment when testing those coupler components.
Both connectorized and nonconnectorized couplers and terminators
can be tested using this plan, provided electrical contact can be
made to all signal (high and low) and shield (ground) connections
of the components.
Multiple stub couplers are tested by repeating the tests
contained herein for each individual stub. An adjustment to the
test limits may be required. The adjustments are specified in the
The tests may be performed in any order unless otherwise
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