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SAE J2052

2016 Edition, July 2016

Complete Document

Test Device Head Contact Duration Analysis

Includes all amendments and changes through Stabilization Notice (No longer revised / updated) , July 2016

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Product Details:

  • Revision: 2016 Edition, July 2016
  • Published Date: July 2016
  • Status: Active, Most Current
  • Document Language: English
  • Published By: SAE International (SAE)
  • Page Count: 7
  • ANSI Approved: No
  • DoD Adopted: No

Description / Abstract:

This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.


The purpose of this SAE Information Report is to describe a computer-adaptable technique for determining head engagement and disengagement times for use in the calculation of the HIC without reliance on contact switches or photography.
AIA/NAS Aerospace Standards