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TIA-455-128

1996 Edition, July 1, 1996

Complete Document

Procedures for Determining Threshold Current of Semiconductor Lasers

Includes all amendments and changes through Reaffirmation Notice , October 6, 2014


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Product Details:

  • Revision: 1996 Edition, July 1, 1996
  • Published Date: October 6, 2014
  • Status: Active, Most Current
  • Document Language: English
  • Published By: Telecommunications Industry Association (TIA)
  • Page Count: 22
  • ANSI Approved: No
  • DoD Adopted: No

Description / Abstract:

Introduction

Intent

Although light emission can occur as soon as current is applied to the semiconductor laser, it does not emit coherent light until the current exceeds a critical value, known as the threshold current. The threshold current is one of the most important parameters for lasers. This procedure provides standard .measurement techniques for semiconductor lasers.

This procedure covers the measurement of the threshold current of semiconductor lasers either as a laser chip placed on a submount to facilitate handling or as an assembled laser package.

Hazards

This procedure involves potentially hazardous operations as discussed in this section. During the measurement, a laser will emit non-visible light. Personnel are strongly cautioned never to look directly into the laser at anytime. Although the optical output power is generally not very high, virtually all the power is concentrated into a narrow frequency band, which implies that the energy can be focused into a very intense spot on the retina by the lens within the viewer's eyes.