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EIA-364-25

Revision E, March 2017

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TP-25E Probe Damage Test Procedure for Electrical Connectors



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Description / Abstract:

This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts as well. This test is to simulate a form of field abuse of contacts during test by inserting probes into socket contacts. The purpose of this test is as follows:

- to simulate probing of socket contacts while installed in the connector for non-removable contacts and for removable contacts while outside of the connector housing;

- to verify performance characteristics of the socket contacts have not been adversely impacted as may be specified in the referencing document (i.e. engagement and separation forces).