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JEDEC JESD 22-B105 Revision E, February 1, 2018
Lead Integrity

JEDEC JESD 22-B105

Revision E, February 1, 2018

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Lead Integrity
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JEDEC JESD 220 Revision D, January 1, 2018
Universal Flash Storage (UFS) Version 3.0

JEDEC JESD 220

Revision D, January 1, 2018

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Universal Flash Storage (UFS) Version 3.0
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JEDEC JESD 220-2 Revision A, January 1, 2018
Universal Flash Storage (UFS) Card Extension Version 1.1

JEDEC JESD 220-2

Revision A, January 1, 2018

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Universal Flash Storage (UFS) Card Extension Version 1.1
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JEDEC JESD 223 Revision D, January 1, 2018
Universal Flash Storage Host Controller Interface (UFSHCI) Version 3.0

JEDEC JESD 223

Revision D, January 1, 2018

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Universal Flash Storage Host Controller Interface (UFSHCI) Version 3.0
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JEDEC JESD 50 Revision C, January 1, 2018
Special Requirements for Maverick Product Elimination and Outlier Management

JEDEC JESD 50

Revision C, January 1, 2018

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Special Requirements for Maverick Product Elimination and Outlier Management
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JEDEC JEP 176 2018 Edition, January 1, 2018
ADAPTER TEST BOARD RELIABILITY TEST GUIDELINES

JEDEC JEP 176

2018 Edition, January 1, 2018

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ADAPTER TEST BOARD RELIABILITY TEST GUIDELINES
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JEDEC JESD 204 Revision C, December 1, 2017
Serial Interface for Data Converters

JEDEC JESD 204

Revision C, December 1, 2017

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Serial Interface for Data Converters
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JEDEC JESD 69 Revision C, November 1, 2017
Information Requirements for the Qualification of Silicon Devices

JEDEC JESD 69

Revision C, November 1, 2017

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Information Requirements for the Qualification of Silicon Devices
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JEDEC JESD 16 Revision B, November 1, 2017
Assessment of Average Outgoing Quality Levels in Parts Per Million (PPM)

JEDEC JESD 16

Revision B, November 1, 2017

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Assessment of Average Outgoing Quality Levels in Parts Per Million (PPM)
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JEDEC JESD 37 Revision A, August 1, 2017
LOGNORMAL ANALYSIS OF UNCENSORED DATA AND OF SINGLY RIGHT-CENSORED DATA UTILIZING THE PERSSON AND ROOTZEN METHOD

JEDEC JESD 37

Revision A, August 1, 2017

Complete Document
 
LOGNORMAL ANALYSIS OF UNCENSORED DATA AND OF SINGLY RIGHT-CENSORED DATA UTILIZING THE PERSSON AND ROOTZEN METHOD
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JEDEC JESD 8-30 2017 Edition, September 1, 2017
POD125 - 1.25 V Pseudo Open Drain I/O

JEDEC JESD 8-30

2017 Edition, September 1, 2017

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POD125 - 1.25 V Pseudo Open Drain I/O
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JEDEC JESD 214 2015 Edition, August 1, 2017
Constant-Temperature Aging Method to Characterize Copper Interconnect Metallization for Stress-Induced Voiding
Includes all amendments and changes through 01, August 2017

JEDEC JESD 214

2015 Edition, August 1, 2017

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Constant-Temperature Aging Method to Characterize Copper Interconnect Metallization for Stress-Induced Voiding
Includes all amendments and changes through 01, August 2017
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JEDEC JESD 30 Revision H, August 1, 2017
Descriptive Designation System for Electronic-device Packages

JEDEC JESD 30

Revision H, August 1, 2017

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Descriptive Designation System for Electronic-device Packages
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JEDEC JEP 175 2017 Edition, July 1, 2017
DDR4 PROTOCOL CHECKS

JEDEC JEP 175

2017 Edition, July 1, 2017

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DDR4 PROTOCOL CHECKS
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JEDEC JESD 245 Revision B, July 1, 2017
Byte Addressable Energy Backed Interface
Includes all amendments and changes through Change/Amendment , July 2017

JEDEC JESD 245

Revision B, July 1, 2017

Complete Document
 
Byte Addressable Energy Backed Interface
Includes all amendments and changes through Change/Amendment , July 2017
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JEDEC JESD 250 2017 Edition, July 1, 2017
GRAPHICS DOUBLE DATA RATE (GDDR6) SGRAM STANDARD

JEDEC JESD 250

2017 Edition, July 1, 2017

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GRAPHICS DOUBLE DATA RATE (GDDR6) SGRAM STANDARD
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JEDEC JESD 224 Revision A, July 1, 2017
Universal Flash Storage (UFS) Test

JEDEC JESD 224

Revision A, July 1, 2017

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Universal Flash Storage (UFS) Test
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JEDEC JESD 22-B116 Revision B, April 1, 2017
Wire Bond Shear Test Method

JEDEC JESD 22-B116

Revision B, April 1, 2017

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Wire Bond Shear Test Method
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JEDEC JESD 9 Revision C, May 1, 2017
Inspection Criteria for Microelectronic Packages and Covers

JEDEC JESD 9

Revision C, May 1, 2017

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Inspection Criteria for Microelectronic Packages and Covers
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JEDEC JS-001 2017 Edition, January 1, 2017
Electrostatic Discharge Sensitivity Testing Human Body Model (HBM) - Component Level

JEDEC JS-001

2017 Edition, January 1, 2017

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Electrostatic Discharge Sensitivity Testing Human Body Model (HBM) - Component Level
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SAME AS ESDA/JEDEC JS-001
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