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JEDEC JEP 131 Revision C, August 1, 2018
Potential Failure Mode and Effects Analysis (FMEA)

JEDEC JEP 131

Revision C, August 1, 2018

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Potential Failure Mode and Effects Analysis (FMEA)
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JEDEC JESD 22-A117 Revision D, August 1, 2018
Electrically Erasable Programmable ROM (EEPROM) Program/Erase Endurance and Data Retention Stress Test

JEDEC JESD 22-A117

Revision D, August 1, 2018

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Electrically Erasable Programmable ROM (EEPROM) Program/Erase Endurance and Data Retention Stress Test
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JEDEC JESD 251 2018 Edition, July 1, 2018
EXpanded Serial Peripheral Interface (xSPI) for Non Volatile Memory Devices

JEDEC JESD 251

2018 Edition, July 1, 2018

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EXpanded Serial Peripheral Interface (xSPI) for Non Volatile Memory Devices
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VERSION 1.0
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JEDEC JESD 47 Revision K, August 1, 2018
Stress-Test-Driven Qualification of Integrated Circuits

JEDEC JESD 47

Revision K, August 1, 2018

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Stress-Test-Driven Qualification of Integrated Circuits
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JEDEC JEP 132 Revision A, August 1, 2018
Process Characterization Guideline

JEDEC JEP 132

Revision A, August 1, 2018

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Process Characterization Guideline
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JEDEC JESD 216 Revision C, August 1, 2018
Serial Flash Discoverable Parameters (SFDP)

JEDEC JESD 216

Revision C, August 1, 2018

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Serial Flash Discoverable Parameters (SFDP)
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JEDEC JESD 22-B112 Revision B, August 1, 2018
Package Warpage Measurement of Surface-Mount Integrated Circuits at Elevated Temperature

JEDEC JESD 22-B112

Revision B, August 1, 2018

Complete Document
 
Package Warpage Measurement of Surface-Mount Integrated Circuits at Elevated Temperature
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JEDEC JEP 155 Revision B, July 1, 2018
Recommended ESD Target Level for HBM Qualification

JEDEC JEP 155

Revision B, July 1, 2018

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Recommended ESD Target Level for HBM Qualification
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JEDEC JESD 671 Revision C, July 1, 2018
Device Quality Problem Analysis and Corrective Action Resolution Methodology

JEDEC JESD 671

Revision C, July 1, 2018

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Device Quality Problem Analysis and Corrective Action Resolution Methodology
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JEDEC J-STD-033 Revision D, April 1, 2018
Handling, Packing, Shipping and Use of Moisture, Reflow, and Process Sensitive Devices

JEDEC J-STD-033

Revision D, April 1, 2018

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Handling, Packing, Shipping and Use of Moisture, Reflow, and Process Sensitive Devices
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SAME AS J-STD-033
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JEDEC JESD 8-31 2018 Edition, March 1, 2018
1.8 V HIGH-SPEED LVCMOS (HS_LVCMOS) INTERFACE

JEDEC JESD 8-31

2018 Edition, March 1, 2018

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1.8 V HIGH-SPEED LVCMOS (HS_LVCMOS) INTERFACE
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JEDEC JESD 22-A111 Revision B, March 1, 2018
Evaluation Procedure for Determining Capability to Bottom Side Board Attach by Full Body Solder Immersion of Small Surface Mount Solid State Devices

JEDEC JESD 22-A111

Revision B, March 1, 2018

Complete Document
 
Evaluation Procedure for Determining Capability to Bottom Side Board Attach by Full Body Solder Immersion of Small Surface Mount Solid State Devices
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JEDEC JESD 72 Revision A, March 1, 2018
Test Methods and Acceptance Procedures for the Evaluation of Polymeric Materials

JEDEC JESD 72

Revision A, March 1, 2018

Complete Document
 
Test Methods and Acceptance Procedures for the Evaluation of Polymeric Materials
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JEDEC/ECA JS709 Revision C, March 1, 2018
Definition of “Low-Halogen” For Electronic Products

JEDEC/ECA JS709

Revision C, March 1, 2018

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Definition of “Low-Halogen” For Electronic Products
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JEDEC JESD 22-B107 Revision D, March 1, 2011
Mark Permanency
Includes all amendments and changes through Reaffirmation Notice , January 2018

JEDEC JESD 22-B107

Revision D, March 1, 2011

Complete Document
 
Mark Permanency
Includes all amendments and changes through Reaffirmation Notice , January 2018
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JEDEC JESD 8-21 Revision B, March 1, 2018
POD135 ‐ 1.35 V Pseudo Open Drain I/O

JEDEC JESD 8-21

Revision B, March 1, 2018

Complete Document
 
POD135 ‐ 1.35 V Pseudo Open Drain I/O
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JEDEC JEP 156 Revision A, March 1, 2018
Chip-Package Interaction Understanding, Identification, and Evaluation

JEDEC JEP 156

Revision A, March 1, 2018

Complete Document
 
Chip-Package Interaction Understanding, Identification, and Evaluation
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JEDEC JESD 248 Revision A, March 1, 2018
DDR4 NVDIMM-N Design Specification

JEDEC JESD 248

Revision A, March 1, 2018

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DDR4 NVDIMM-N Design Specification
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JEDEC JESD 22-B105 Revision E, February 1, 2018
Lead Integrity

JEDEC JESD 22-B105

Revision E, February 1, 2018

Complete Document
 
Lead Integrity
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JEDEC JESD 220 Revision D, January 1, 2018
Universal Flash Storage (UFS) Version 3.0

JEDEC JESD 220

Revision D, January 1, 2018

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Universal Flash Storage (UFS) Version 3.0
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