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JEDEC JESD 8-30 2017 Edition, September 1, 2017
POD125 - 1.25 V Pseudo Open Drain I/O

JEDEC JESD 8-30

2017 Edition, September 1, 2017

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POD125 - 1.25 V Pseudo Open Drain I/O
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JEDEC JESD 214 2015 Edition, August 1, 2017
Constant-Temperature Aging Method to Characterize Copper Interconnect Metallization for Stress-Induced Voiding
Includes all amendments and changes through 01, August 2017

JEDEC JESD 214

2015 Edition, August 1, 2017

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Constant-Temperature Aging Method to Characterize Copper Interconnect Metallization for Stress-Induced Voiding
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JEDEC JESD 30 Revision H, August 1, 2017
Descriptive Designation System for Electronic-device Packages

JEDEC JESD 30

Revision H, August 1, 2017

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Descriptive Designation System for Electronic-device Packages
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JEDEC JEP 175 2017 Edition, July 1, 2017
DDR4 PROTOCOL CHECKS

JEDEC JEP 175

2017 Edition, July 1, 2017

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DDR4 PROTOCOL CHECKS
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JEDEC JESD 245 Revision B, July 1, 2017
Byte Addressable Energy Backed Interface
Includes all amendments and changes through Change/Amendment , July 2017

JEDEC JESD 245

Revision B, July 1, 2017

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Byte Addressable Energy Backed Interface
Includes all amendments and changes through Change/Amendment , July 2017
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JEDEC JESD 250 2017 Edition, July 1, 2017
GRAPHICS DOUBLE DATA RATE (GDDR6) SGRAM STANDARD

JEDEC JESD 250

2017 Edition, July 1, 2017

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GRAPHICS DOUBLE DATA RATE (GDDR6) SGRAM STANDARD
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JEDEC JESD 224 Revision A, July 1, 2017
Universal Flash Storage (UFS) Test

JEDEC JESD 224

Revision A, July 1, 2017

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Universal Flash Storage (UFS) Test
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JEDEC JESD 22-B116 Revision B, April 1, 2017
Wire Bond Shear Test Method

JEDEC JESD 22-B116

Revision B, April 1, 2017

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Wire Bond Shear Test Method
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JEDEC JESD 9 Revision C, May 1, 2017
Inspection Criteria for Microelectronic Packages and Covers

JEDEC JESD 9

Revision C, May 1, 2017

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Inspection Criteria for Microelectronic Packages and Covers
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JEDEC JS-001 2017 Edition, January 1, 2017
Electrostatic Discharge Sensitivity Testing Human Body Model (HBM) - Component Level

JEDEC JS-001

2017 Edition, January 1, 2017

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Electrostatic Discharge Sensitivity Testing Human Body Model (HBM) - Component Level
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JEDEC JESD 213 Revision A, April 1, 2017
Standard Test Method Utilizing X-Ray Fluorescence (XRF) for Analyzing Component Finishes and Solder Alloys to Determine Tin (Sn) – Lead (Pb) Content

JEDEC JESD 213

Revision A, April 1, 2017

Complete Document
 
Standard Test Method Utilizing X-Ray Fluorescence (XRF) for Analyzing Component Finishes and Solder Alloys to Determine Tin (Sn) – Lead (Pb) Content
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JEDEC JESD 659 Revision C, January 1, 2017
Failure-Mechanism-Driven Reliability Monitoring

JEDEC JESD 659

Revision C, January 1, 2017

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Failure-Mechanism-Driven Reliability Monitoring
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JEDEC JESD 210 2017 Edition, March 1, 2017
Avalanche Breakdown Diode (ABD) Transient Voltage Suppressors

JEDEC JESD 210

2017 Edition, March 1, 2017

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Avalanche Breakdown Diode (ABD) Transient Voltage Suppressors
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JEDEC JESD 209-4 Revision B, February 1, 2017
Low Power Double Date Rate 4 (LPDDR4)

JEDEC JESD 209-4

Revision B, February 1, 2017

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Low Power Double Date Rate 4 (LPDDR4)
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JEDEC JESD 79-4 Addendum 1, February 1, 2017
3D Stacked DRAM

JEDEC JESD 79-4

Addendum 1, February 1, 2017

Addendum 1 Only
 
3D Stacked DRAM
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JEDEC JESD 82-32 2016 Edition, November 1, 2016
DDR4 Data Buffer Defintion (DDR4DB01)

JEDEC JESD 82-32

2016 Edition, November 1, 2016

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DDR4 Data Buffer Defintion (DDR4DB01)
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JEDEC JESD 82-31 2016 Edition, August 1, 2016
DDR4 Registering Clock Driver - DDR4RCD01

JEDEC JESD 82-31

2016 Edition, August 1, 2016

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DDR4 Registering Clock Driver - DDR4RCD01
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JEDEC JESD 22-A108 Revision E, December 1, 2016
Temperature, Bias, and Operating Life
Includes all amendments and changes through Change/Amendment , December 2016

JEDEC JESD 22-A108

Revision E, December 1, 2016

Complete Document
 
Temperature, Bias, and Operating Life
Includes all amendments and changes through Change/Amendment , December 2016
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JEDEC JESD 8-29 2016 Edition, December 1, 2016
0.6 V Low Voltage Swing Terminated Logic (LVSTL06)

JEDEC JESD 8-29

2016 Edition, December 1, 2016

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0.6 V Low Voltage Swing Terminated Logic (LVSTL06)
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JEDEC JESD 212 Revision C, February 1, 2016
GRAPHICS DOUBLE DATA RATE (GDDR5) SGRAM STANDARD

JEDEC JESD 212

Revision C, February 1, 2016

Complete Document
 
GRAPHICS DOUBLE DATA RATE (GDDR5) SGRAM STANDARD
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