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AEC Q100 Revision H, September 11, 2014
FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR INTEGRATED CIRCUITS

AEC Q100

Revision H, September 11, 2014

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AEC Q101 Revision D1, September 6, 2013
FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR DISCRETE SEMICONDUCTORS IN AUTOMOTIVE APPLICATIONS

AEC Q101

Revision D1, September 6, 2013

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AEC Q200 Revision D, June 1, 2010
STRESS TEST QUALIFICATION FOR PASSIVE COMPONENTS

AEC Q200

Revision D, June 1, 2010

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STRESS TEST QUALIFICATION FOR PASSIVE COMPONENTS
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AEC Q200-003 Revision B, June 1, 2010
BEAM LOAD (BREAK STRENGTH) TEST

AEC Q200-003

Revision B, June 1, 2010

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BEAM LOAD (BREAK STRENGTH) TEST
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AEC Q200-006 Revision A, June 1, 2010
TERMINAL STRENGTH (SMD) / SHEAR STRESS TEST

AEC Q200-006

Revision A, June 1, 2010

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TERMINAL STRENGTH (SMD) / SHEAR STRESS TEST
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